Szukana fraza: [Abstrakt = "In the paper the results of measurements of capacitances C\(u\) of the current controlled BJT and SJT transistors was presented, for which a programmable measuring system manufactured by Keithley was used. The results of measurements was compared with results of the calculations obtained by using the popular and commonly used Gummel\-Poon model. For comparison, the results of the measurements found in the literature and in the datasheets of the considered devices was presented as well. In addition, the influence of ambient temperature on the shape of the considered characteristics was also investigated."]

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